Addressing the stress-related functional limitations of thin-film Li-ion components for energy-intensive applications - StressLIC

Project summary

For electric cars to compete with traditional cars and complete an industrial transition required for global sustainability, we need Li-ion batteries (LIBs) with energy density 500% higher than current technology permits. Such a disruptive innovation is only feasible if we understand how mechanical stress gradients degrade battery performance on the nanoscale, and take remedial action. The StressLIC consortium will characterize and propose remedies for the stress-related limitations of current LIBs, by combining cutting-edge thin film measurement and simulation techniques from several disciplines. StressLIC is committed to improving battery performance in terms of capacity, power, lifetime and safety. The consortium includes three leading EU Labs specialized in nanoscale materials science, an expert in LIBs from Sandia National Lab, and a large battery-analysis EU company.

Project Details

Call

Call 2018


Call Topic

Innovative surfaces, coatings and interfaces


Project start

01.03.2019


Project end

28.02.2023


Total project costs

666.573 €


Total project funding

431.616 €


TRL

1 - 4


Coordinator

Prof. Dr. Celia Polop Jordá

Universidad Autónoma de Madrid , CIF: ES0000Q2818013-A, 28049 Madrid, Spain


Partners and Funders Details

Consortium Partner   Country Funder
Universidad Autónoma de Madrid
https://www.uam.es
University Spain ES-AEI
Montanuniversität Leoben
https://www.oeaw.ac.at/esi/
University Austria AT-FFG
Consejo Superior de Investigaciones Científicas
https://www.icmm.csic.es
Research org. Spain ES-AEI
Sandia National Laboratories
https://www.sandia.gov
Research org. United States No Funding
Anstalt für Verbrennungskraftmaschinen List (AVL List GmbH)
https://www.avl.com/de/battery1
Large industry Austria AT-FFG

Keywords

residual stress, electrochemical energy storage, nanocharacterisation, lithium battery, energy harvesting, scanning probe microscopy, X-ray diffraction